Description
This concentric circles graticle from Electron Microscopy Sciences is designed for precise two-way measurement applications in microscopy. It features a graticle pattern identified as NE47, specifically engineered for detailed analysis. The graticle has a diameter of 19 mm, making it suitable for integration into various microscope eyepiece systems. Manufactured to high standards, this tool is essential for accurate calibration and measurement tasks in scientific research and laboratory settings.
- Designed for two-way measurement applications.
- Features the NE47 concentric circles pattern.
- 19 mm diameter for eyepiece integration.
Shop today for the Concentric Circles Graticle to meet your measurement requirements!






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