Description
The Tin-C Test Specimen from Electron Microscopy Sciences is designed for use with 12.5mm pin stubs. This calibration standard is specifically engineered for applications in Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM), Auger, and Focused Ion Beam (FIB) technologies. It provides a reliable surface for instrument calibration and performance verification.
- Designed for 12.5mm pin stub compatibility.
- Suitable for AFM, SEM, Auger, and FIB applications.
- Ensures accurate instrument calibration.
Shop today for the Tin-C Test Specimen to meet your requirements!
Reviews
There are no reviews yet.