80123-1D-AFM Electron Microscopy Sciences SPM Calibrator, 300-1D for AFM

Description

This SPM Calibrator from Electron Microscopy Sciences is designed for Atomic Force Microscopy (AFM) applications. It features a 1-Dimensional calibration standard with a nominal size of 300nm. This instrument is essential for ensuring the accuracy and reliability of scanning probe microscopy measurements.

• 1-Dimensional calibration standard
• Designed for AFM applications
• Nominal size of 300nm

Enhance your microscopy research with this precise calibration tool.