80095-SC25 Electron Microscopy Sciences MAC Auger Electron Microscopy Standards, 21 Semiconductor Materials, 25 mm Block

Description

The Electron Microscopy Sciences MAC Auger Electron Microscopy Standards, specifically the 80095-SC25 model, are designed for advanced X-ray microanalysis applications. This reference standard features 21 semiconductor materials integrated into a 25mm block, providing a reliable tool for calibration and analysis in electron microscopy.

• Contains 21 semiconductor materials for comprehensive analysis.
• Presented in a convenient 25mm block format.
• Specifically designed for X-ray microanalysis in electron microscopy.

Enhance your microanalysis capabilities with this precision-engineered standard.