75830-10 Electron Microscopy Sciences JEOL SEM Mount, 25 x 20 mm, 3/8″ Head

Description

This JEOL SEM Mount from Electron Microscopy Sciences is designed for use with JEOL scanning electron microscopes. It features an aluminum construction and a standard head size of 3/8 inch (10mm) with a height of 3/16 inch (5mm). The mount measures 25 mm by 20 mm, providing a stable platform for sample preparation and analysis in electron microscopy applications.

• Standard aluminum construction for durability.
• Designed for JEOL SEM systems.
• Precise dimensions for secure sample mounting.

Enhance your microscopy workflow with this reliable SEM mount.