Description
This product from Electron Microscopy Sciences is designed as a specialized mount for the JEOL JSM 840 scanning electron microscope. It is available in both aluminum and carbon materials, catering to different analytical needs. The mount features precise dimensions of 12.5 x 5 mm, ensuring compatibility with the specified instrument. Manufactured to high standards, these mounts are essential for sample preparation in advanced microscopy applications.
- Designed for JEOL JSM 840 SEM
- Available in Aluminum and Carbon materials
- Dimensions: 12.5 x 5 mm
Order your JEOL JSM 840 SEM Mounts today!






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