Description
These Aluminum and Carbon mounts are specifically designed for use with the JEOL JSM 840 scanning electron microscope. Each mount measures 12.5 x 5 mm, providing a precise platform for sample preparation and analysis. Manufactured by Electron Microscopy Sciences, these mounts ensure compatibility and reliable performance in demanding microscopy applications.
- Designed for JEOL JSM 840 SEM
- Durable Aluminum and Carbon construction
- Precise 12.5 x 5 mm dimensions
Enhance your microscopy workflow with these essential sample mounts!






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