Description
This SEM mount features a slotted head design, constructed from durable aluminum, and is compatible with a wide range of scanning electron microscopes including FEI/Philips, ZEISS/LEO, Cambridge, Leica, Amray, Tescan, and Camscan. It is designed for standard SEM stub applications, ensuring reliable sample mounting for microscopy analysis. The mount is engineered to meet the rigorous demands of electron microscopy laboratories.
- Constructed from aluminum for durability.
- Features a slotted head for secure sample placement.
- Compatible with numerous SEM models.
Upgrade your microscopy workflow with this high-quality SEM mount.
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