Description
This Aluminum and Carbon Mount is specifically designed for the JEOL JSM 840 scanning electron microscope. It features a standard aluminum construction and precise dimensions of 12.5 x 5 mm, ensuring compatibility and optimal performance for sample preparation in electron microscopy applications. Manufactured by Electron Microscopy Sciences, this mount is built to meet the rigorous demands of scientific research.
- Standard Aluminum construction
- Designed for JEOL JSM 840 SEM
- Dimensions: 12.5 x 5 mm
Upgrade your microscopy workflow with this reliable SEM mount!
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